Visualization of pharmaceuticals using ultra-low acceleration voltage SEM.
We utilize cutting-edge electron microscopy observation techniques to meet the needs of our customers in the pharmaceutical field.
To observe and analyze the extreme surface and cross-section of samples at the nanoscale using electron microscopy, it is essential to have sample preparation techniques that avoid damage and contamination during processing. Our company provides cutting-edge observation and analysis data using ultra-low acceleration voltage scanning electron microscopy (ULV-SEM) and aberration-corrected scanning transmission electron microscopy (Cs-STEM), after processing samples using the optimal methods developed through our accumulated sample preparation technology.
- Company：JFEテクノリサーチ
- Price：Other
